Certus Optic includes:
|XYZ scanning head Certus;||XYZ scanning head Certus;|
|XY-scanning stage Ratis||XY-scanning stage Ratis|
|Inverted optical microscope||Upright optical microscope
|Integrated mechanical XY-stage for sample adjustment||Integrated mechanical XY-stage for sample adjustment|
|-||Mechanical Z-stage for objective
|Z-objective nanofocusing stage Vectus*||Z-objective nanofocusing stage Vectus
|SPM controller EG-3000||SPM controller EG-3000|
|NSpec software package.||NSpec software package.|
|*Optional for Certus Optic I
|A - Optical microscope
|| B - XYZ AFM head Certus
|C - Nano piezo scanning stage
D - Z-objective nanofocusing stage
Certus Optic is indispensable tool to study physical and chemical properties of the surface in such areas as:
Scanning surface of polymer.
Certus Optic can be easily upgraded to our Centaur (HR) SPM-Confocal-Spectroscopy system.
Certus Optic is an essential part of any of the experimental setup for investigation of TERS/FRET effects.
XYZ SPM head “Certus” contains several probe holders: for standard cantilevers, for “tuning fork” type SPM probes with horizontal and vertical orientation, for STM tips. Any custom design tip holders may be developed by our R&D team by customer request.
One has to change tip holder to change SPM mode.
It is convenient to have several tip holders for use SPM head in cleaned areas, boxes. In this case, only tip holders are being transferred though transition chambers and hatches. You don’t need to move head (SPM microscope).
Scanning surface of bio sample.
||Built-in XYZ scanner|
||Scanning/positioning XYZ range||100x100x15 μm|
||XY stage resonant frequency||1 кHz|
||Z rezonant frequency||7 кHz|
||SPM resolution (XY lateral)||<1 nm|
|126.96.36.199||SPM resolution (Z vertical)||<0.1 nm|
|188.8.131.52||Measuring principle||Time-to-digital convertion|
|1.1.3||Scanning head approach system|
|184.108.40.206||Minimum step||1 μm|
|220.127.116.11||Coarse approach implementation||Stepper motors|
|18.104.22.168||Number of stepper motors||3|
|1.2.1||Built-in XY plain-paralllel stage|
|22.214.171.124||XY scanning range||100x100 μm|
|126.96.36.199||XY resonant frequency||1 kHz|
|188.8.131.52||Measuring principle||Time-to-digital convertion|
|1.3.1||Sample coarse positionig range||5x5 mm|
|1.3.3||Positionig accuracy||~ 5 μm|
|2.1||Type, manufacturer and specifications of the microscope||Optionally, in accordance with the terms of the specification either upright or inverted microscope|