Scanning confocal Raman spectrometer with AFM option

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ARS3000

The main advantages of the system are:

  1. Compact size.
  2. Full automation of the system.
  3. The original design of the spectrometer.
  4. High light transmission of the device with minimal optical loss.
  5. The confocal circuit is made according to the original scheme, provides compact dimensions and minimal drifts of optical elements.
  6. Built-in optical microscope provides a convenient search for a place for measurements.
  7. The design uses precision mechanical components and optics.
  8. Can be used both in industrial laboratories and in research universities.
  9. Base configuration price 200 000 USD.

 

The main components of the system are:

A. An automated base with a built-in flat scanner for the sample.

B. The confocal module containing the optical circuit of the excitation beam formation and the secondary (Raman radiation) detection channel.

C. Highly sensitive CCD sensor with deep cooling for recording secondary radiation spectra.

D. Trinocular optical microscope with the ability to observe the sample in both the eyepieces and the video camera.

E. Solid-state excitation laser, optional 355 nm, 473 nm, 532 nm, 785 nm. For connection of external lasers with other lines one-mode transport optical fiber is used.

F. Monochromator

G. Atomic Force Head for recording the signals of the sample topography.

H. PMU single-channel detector.

I. HeNe laser as a base for Raman spectroscopy.

Optical scheme


Optical sensitivity. 4 th order raman responce from silica.

Spectral Resolution and range. HgNe calibration lamp spectra.

HgNe Lamp Spectra

Surface optical maping:

Laser confocal maping. Sample Si/SiO2 grating .

Raman maping. Образец Si/SiO2 grating.
Raman maping. Образец Si/SiO2 grating. Optica Image. 100x magnification micro objective.

Atomic Force microscopy maping:

Base Specification:

AFM resolution
 < 1 nm
Z AFM resolution
 <0.1 nm
Scanning range
 100x100x15 mkm
Secondary emission spectral range
 100..5000 cm-1
Spectral resolution
 <1 cm-1
Optical throughput
>80%
Exitation laser
 532 nm
Detector Andor iVac 324 FI
Pixels number
 1560x200 pixels
Pixel size
 16 mkm
Cooling till -60o
CCD read noise
 5.8 e
dark curent
 0.0028 e/pix/s
Мах speed
 269 spectra/s
Monochromator  Andor Shamrock 500 i
Focal distance
 500 mm
Diff. gratings
150   lines/mm Blaze WL = 500 nm,  resolution = 0.52 nm
600   lines/mm Blaze WL = 500 nm,  resolution = 0.13 nm
1800 lines/mm Blaze WL = 380 nm,  resolution = 0.04 nm
Input pinhole
 Constant 100 mkm
Laser Cobolt
Type NdYg
WL
 532.8 nm
Power 25 мВт
Linght width
 < 1 pm
Upright optical microscope Olympus BX51
Illumination system
 Diod source
Power
 100W
Illumination Type
 Kohler
Eyepiece widefield с 10х/24 mm
Interdistance
 50-70 mm
Trinocular with light path selector
 Prizm 0:100, 50:50
Focus system
 Motorized
Accuracy
 100 nm
VideoCamera Moticam 2X
Type                                                                                       
1/2” CMOS
Resolution, px 2500x1800
ADC resolution
 12 бит
Pixrl size
 2.5 мкм
Interface WiFi
Microobjective module
Type Turret for 4 objectives
Objective 1
SLMPLN 50X
Optical amplification 50x
N.A. 0.35
WD 18 mm
Objective 2
MPLFLN 100X
Optical amplification 100x
N.A. 0.9
WD 1 mm
Sample positioning
Type Motorized XYZ
Range 10x10x10mm
Accuracy 1mkm
AFM head positioning
Type Motorized XY
Range 10x10mm
Accuracy 1mkm
Optical, AFM, scanning system
Тype Flat XYZ stage
Range
 80μmx80μmx15 μm
Resolution
 < 0.01nm
Accuracy
 < 1nm
image nonlinearity
 <1%
Position sensors
Type

Optical encoders with sin/cos interpolation, 300 kHz

sampling rate, built-in autocallibration

AFM unit, AFM head Certus
PSD sensor 4 sectioned PD
Laser spot arrangement 2 micro screws with 0,125 mm pitch
PSD arrangement 2 micro screws with 0,125 mm pitch
Tip scanning system is optional