 |
Certus Light, Certus Standard, Certus Optic, Centaur, Centaur HR, EG-3000, Ratis, Snotra.
|
 |
|
Download *.pdf |
Basic datasheets:
|
- Support of all basic SPM techniques: Atomic Force Microscopy (AFM, contact and non-contact), shear force AFM, force spectroscopy, Scanning Tunneling Microscopy (STM) etc.;
- Plane-parallel scanning (in X-Y plane) allows imaging with minimal distortion;
- Open design of scanning head simplifies observation of the sample and probe at any angle from 0° to 90°;
- Certus Light is suitable for installation on the optical microscope (upright or inverted), and can also be modified to Certus Standard, Certus Optic and Centaur.
|
 |
|
Download *.pdf |
- Implementation of all basic SPM techniques: Atomic Force Microscopy (AFM, contact and non-contact), shear force AFM, force spectroscopy, Scanning Tunneling Microscopy (STM) etc.;
- Plane-parallel scanning (in X-Y plane) allows imaging with minimal distortion;
- Parallel head approach system;
- Open design of scanning head simplifies observation of the sample and probe at any angle from 0° to 90°;
- Certus Standard is suitable for installation on the optical microscope (upright or inverted), and can also be modified to Certus Optic and Centaur.
|
 |
|
Download *.pdf |
- Two scanning modes: XY sample scanning with stage and Z scanning with head scanner, or XYZ probe scanning with head scanner. Scanning stage Ratis can position the sample with sub-nanometer accuracy;
- Plane-parallel scanners in head and base allows measurements without distortion typical for tube scanners;
- Study both transparent and non-transparent samples (depending on the microscope type);
- Optical microscope makes it possible to use all traditional observation techniques for sample studying. So one can easily find appropriate area on the sample and position the tip over it. Certus Optics can be equipped with brand new microscope or adopted for the customers one;
- Independent systems of sample and probe positioning give a possibility to put the sample in the middle of field of view and install probe over it;
- Certus Optic can be integrated with spectroscopic devices and can be upgraded to Centaur.
|
 |
| Download *.pdf |
- Dual independent scanners (in head and base);
- Multiple simultaneous signal recording (confocal, spectra, topography, phase etc.);
- Full spectra recording in each scan point;
- Integration with virtually unmodified upright or inverted optical microscopes to work with transparent and none transparent samples;
- Modern cross-platform software (for all the Centaur units).
|
 |
|
Download *.pdf |
|
Ratis – a family of plane-parallel devices for positioning/scanning, developed by engineers NST.
|
 |
|
Download *.pdf |
|
Electronic controller EG-3000 is designed to control SPM or scanning confocal microscope. Controller provides data acquisition from internal sensors and external devices, applies control voltage to scanners piezoelectric actuators. All obtained information is transferring to PC workstation for visualization and processing. |
 |
|
Download *.pdf |
NSpec - Universal SPM software:
|
NSpec – Universal software for all NST devices. Nspec controls all EG-3000 functionality, and all devices connected to controller (SPM Certus, scanning stage Ratis, stepper motors etc.).
|
|
|
Download NSpec |
