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• Products
  • AFM, Confocal, Raman, Fluorescence System
  • Centaur I (АСМ/Раман)
  • Centaur I HR (АСМ/Раман)
  • Centaur U (АСМ/Раман)
  • Centaur U HR (АСМ/Раман)
  • Centaur Duos (ACМ/Раман)
  • ARS3000
  • Certus Optic (SPM + Optical Microscope)
  • Certus Optic I
  • Certus Optic U
  • Certus Optic Duos
  • Certus (SPM)
  • Certus Light
  • Certus Standard
  • Certus NSOM
  • SPM V series
  • Certus Standard V
  • Certus Light V
  • Nano Positioning Devices
  • Ratis XYZ_H
  • Vectus Z stage
  • Ratis 1X stage
  • EG (Controllers)
  • EG-1100
  • EG-5000
  • NSpec (Software)
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• DPSS lasers
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Products

 

Nano Scan Technologies Ltd. develops, produces and sales scanning probe microscopes (SPM, atomic force microscopes - AFM) for scientific and applied research applications, also combined with optical microscopes, spectral devices (AFM Raman) and ultramicrotomes. Design principles of NST devices allow easy change and modification of SPM type. Same device with minimal modifications can be used for a number of SPM modes such as scanning tunnel, atomic force, electric force, scanning Kelvin probe, magnetic force, magnetic resonance force, scanning capacitance, scanning Hall probe and electrochemical scanning tunnel microscopy as well as for nanolithography applications.

 

 

Basic NST products include:

Product	Description	Price
ARS 3000	Confocal scanning Raman  spectrometer. Optical microscope. Confocal laser microscope. Confocal fluorescence microscope. Scanning probe microscope (atomic force microscope); Raman scattering spectrometer c high spectral resolution; More Information...	30 000 000 RUR
Certus Light V	Scanning probe microscope (atomic force microscope). A complete set of SPM techniques. Scanning by sample. Exact positioning of the sample. Built-in optical microscope for surface observation and alignment of the AFM head. More Information...	5 000 000 RUR
Certus Standard V	Scanning probe microscope (atomic force microscope). A complete set of SPM techniques. Scanning by sample. Exact positioning of the sample. Professional optical microscope for surface observation and alignment of the AFM head Completely automated. More Information...	8 000 000 RUR
Certus Light	Scanning probe microscope (atomic force microscope); A complete set of SPM techniques. Scanning with a probe (scanning head). Exact positioning of the sample. More Information...	5 000 000 RUR
Ratis	Piezo stage. Fully independent X, Y, Z axes. No crosstalk. Hi stifness. Built in optical sensors with absolute callibration. More Information...	1 500 000 RUR
Certus Optic U	Scanning probe microscope (atomic force microscope); A complete set of SPM techniques. Scanning by sample. Exact positioning of the sample. Scientific Optical microscope for surface observation and alignment of the AFM head Completely automated. More Information...	15 000 000 RUR
	Scanning probe microscope (atomic force microscope); A complete set of SPM techniques. Scanning by sample. Exact positioning of the sample. Scientific Optical microscope for surface observation and alignment of the AFM head Completely automated. More Information...	15 000 000 RUR