Gallium nitride (GaN) on sapphire surface

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Gallium nitride (GaN) on sapphire surface. AFM image. Semi-contact mode. Topography. Gallium nitride (GaN) on sapphire surface. AFM image. Semi-contact mode. Phase image.
Gallium nitride (GaN) on sapphire surface. AFM image. Semi-contact mode. Profile in cross-section. Gallium nitride (GaN) on sapphire surface. AFM image. Semi-contact mode. Topography and cross-section.

Gallium nitride (GaN) on sapphire surface. AFM images. Semi-contact mode. Images was obtained with SPM Certus Standard.

Image size 25x25 μm. 400x400 points.

Upper left image - topography. Upper left image - phase image.

Lower left image - profile in cross-section. Lower right image - topography and cross-section.

Gallium nitride (GaN) on sapphire surface. AFM image. Semi-contact mode. Topography. Gallium nitride (GaN) on sapphire surface. AFM image. Semi-contact mode. Phase image.
Gallium nitride (GaN) on sapphire surface. AFM image. Semi-contact mode. Profile in cross-section. Gallium nitride (GaN) on sapphire surface. AFM image. Semi-contact mode. Topography and cross-section.

Gallium nitride (GaN) on sapphire surface. AFM images. Semi-contact mode. Images was obtained with SPM Certus Standard.

Image size 10x10 μm. 500x500 points.

Upper left image - topography. Upper left image - phase image.

Lower left image - profile in cross-section. Lower right image - topography and cross-section.

Gallium nitride (GaN) on sapphire surface. AFM image. Semi-contact mode. Topography. Gallium nitride (GaN) on sapphire surface. AFM image. Semi-contact mode. Phase image.
Gallium nitride (GaN) on sapphire surface. AFM image. Semi-contact mode. Profile in cross-section. Gallium nitride (GaN) on sapphire surface. AFM image. Semi-contact mode. Topography and cross-section.

Gallium nitride (GaN) on sapphire surface. AFM images. Semi-contact mode. Images was obtained with SPM Certus Standard.

Image size 5x5 μm. 300x300 points.

Upper left image - topography. Upper left image - phase image.

Lower left image - profile in cross-section. Lower right image - topography and cross-section.

Gallium nitride (GaN) on sapphire surface. AFM image. Semi-contact mode. Topography. Gallium nitride (GaN) on sapphire surface. AFM image. Semi-contact mode. Phase image.
Gallium nitride (GaN) on sapphire surface. AFM image. Semi-contact mode. Profile in cross-section. Gallium nitride (GaN) on sapphire surface. AFM image. Semi-contact mode. Topography and cross-section.

Gallium nitride (GaN) on sapphire surface. AFM images. Semi-contact mode. Images was obtained with SPM Certus Standard.

Image size 2,5x2,5 μm. 300x300 points.

Upper left image - topography. Upper left image - phase image.

Lower left image - profile in cross-section. Lower right image - topography and cross-section.

Gallium nitride (GaN) on sapphire surface. AFM image. Semi-contact mode. Topography. Gallium nitride (GaN) on sapphire surface. AFM image. Semi-contact mode. Phase image.
Gallium nitride (GaN) on sapphire surface. AFM image. Semi-contact mode. Profile in cross-section. Gallium nitride (GaN) on sapphire surface. AFM image. Semi-contact mode. Topography and cross-section.

Gallium nitride (GaN) on sapphire surface. AFM images. Semi-contact mode. Images was obtained with SPM Certus Standard.

Image size 1x1 μm. 200x200 points.

Upper left image - topography. Upper left image - phase image.

Lower left image - profile in cross-section. Lower right image - topography and cross-section.

Gallium nitride (GaN) on sapphire surface. AFM image. Semi-contact mode. Topography. Gallium nitride (GaN) on sapphire surface. AFM image. Semi-contact mode. Phase image.
Gallium nitride (GaN) on sapphire surface. AFM image. Semi-contact mode. Profile in cross-section. Gallium nitride (GaN) on sapphire surface. AFM image. Semi-contact mode. Topography and cross-section.

Gallium nitride (GaN) on sapphire surface. AFM images. Semi-contact mode. Images was obtained with SPM Certus Standard.

Image size 0,5x0,5 μm. 100x100 points.

Upper left image - topography. Upper left image - phase image.

Lower left image - profile in cross-section. Lower right image - topography and cross-section.

Gallium nitride (GaN) on sapphire surface. AFM image. Semi-contact mode. Topography. Gallium nitride (GaN) on sapphire surface. AFM image. Semi-contact mode. Phase image.
Gallium nitride (GaN) on sapphire surface. AFM image. Semi-contact mode. Profile in cross-section. Gallium nitride (GaN) on sapphire surface. AFM image. Semi-contact mode. Topography and cross-section.

Gallium nitride (GaN) on sapphire surface. AFM images. Semi-contact mode. Images was obtained with SPM Certus Standard.

Image size 20x20 μm. 400x400 points.

Upper left image - topography. Upper left image - phase image.

Lower left image - profile in cross-section. Lower right image - topography and cross-section.

Gallium nitride (GaN) on sapphire surface. AFM image. Semi-contact mode. Topography. Gallium nitride (GaN) on sapphire surface. AFM image. Semi-contact mode. Phase image.
Gallium nitride (GaN) on sapphire surface. AFM image. Semi-contact mode. Profile in cross-section. Gallium nitride (GaN) on sapphire surface. AFM image. Semi-contact mode. Topography and cross-section.

Gallium nitride (GaN) on sapphire surface. AFM images. Semi-contact mode. Images was obtained with SPM Certus Standard.

Image size 10x10 μm. 500x500 points.

Upper left image - topography. Upper left image - phase image.

Lower left image - profile in cross-section. Lower right image - topography and cross-section.

Gallium nitride (GaN) on sapphire surface. AFM image. Semi-contact mode. Topography. Gallium nitride (GaN) on sapphire surface. AFM image. Semi-contact mode. Phase image.
Gallium nitride (GaN) on sapphire surface. AFM image. Semi-contact mode. Profile in cross-section. Gallium nitride (GaN) on sapphire surface. AFM image. Semi-contact mode. Topography and cross-section.

Gallium nitride (GaN) on sapphire surface. AFM images. Semi-contact mode. Images was obtained with SPM Certus Standard.

Image size 5x5 μm. 300x300 points.

Upper left image - topography. Upper left image - phase image.

Lower left image - profile in cross-section. Lower right image - topography and cross-section.

Gallium nitride (GaN) on sapphire surface. AFM image. Semi-contact mode. Topography. Gallium nitride (GaN) on sapphire surface. AFM image. Semi-contact mode. Phase image.
Gallium nitride (GaN) on sapphire surface. AFM image. Semi-contact mode. Profile in cross-section. Gallium nitride (GaN) on sapphire surface. AFM image. Semi-contact mode. Topography and cross-section.

Gallium nitride (GaN) on sapphire surface. AFM images. Semi-contact mode. Images was obtained with SPM Certus Standard.

Image size 1x1 μm. 200x200 points.

Upper left image - topography. Upper left image - phase image.

Lower left image - profile in cross-section. Lower right image - topography and cross-section.

 

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