Plasma etching and modification of organic polymers

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Поверхность пленки  ПЭТФ. Без обработки плазмой. АСМ изображение. Полу-контактный режим.  Топография.

Поверхность пленки  ПЭТФ. Травление плазмой 20 минут. АСМ изображение. Полу-контактный  режим. Топография.

Поверхность пленки  ПЭТФ. Травление плазмой 40 минут. АСМ изображение. Полу-контактный  режим. Топография. Поверхность пленки  ПЭТФ. Травление плазмой 60 минут. АСМ изображение. Полу-контактный  режим. Топография.

Without etching

20 min

40 min

60 min

Topography changing film of polyethylene terephthalate (PETE) under the action of the plasma depending on exposure time.

 

PETE film. Without etching. AFM image. Simi-contact mode. Topography. PETE film. Without etching. AFM image. Simi-contact mode. Phase image.
PETE film. Without etching. AFM image. Simi-contact mode. Topography 3D. PETE film. Without etching. AFM image. Simi-contact mode. Topography and cross-section.
PETE film. Without etching. AFM image. Simi-contact mode. Profile in cross-section.

Polyethylene terephthalate (PETE) film. Without etching. Simi-contact-mode. Images was obtained with SPM Certus Standard.

Images size 5х5 μm, 500х500 points.

Upper left image - topography. Upper right image - phase image.

Lower left image - topography 3D. Upper right image - topography and cross-section.

Lower image - profile in cross-section.

PETE film. Without etching. AFM image. Simi-contact mode. Topography. PETE film. Without etching. AFM image. Simi-contact mode. Phase image.
PETE film. Without etching. AFM image. Simi-contact mode. Topography 3D. PETE film. Without etching. AFM image. Simi-contact mode. Topography and cross-section.
PETE film. Without etching. AFM image. Simi-contact mode. Profile in cross-section.

Polyethylene terephthalate (PETE) film. Without etching. Simi-contact-mode. Images was obtained with SPM Certus Standard.

Images size 1,5х1,5 μm, 300х300 points.

Upper left image - topography. Upper right image - phase image.

Lower left image - topography 3D. Upper right image - topography and cross-section.

Lower image - profile in cross-section.

PETE film. Plasma etching - 20 min. AFM image. Simi-contact mode. Topography. PETE film. Plasma etching - 20 min. AFM image. Simi-contact mode. Phase image.
PETE film. Plasma etching - 20 min. AFM image. Simi-contact mode. Topography 3D. PETE film. Plasma etching - 20 min. AFM image. Simi-contact mode. Topography and cross-section.
PETE film. Plasma etching - 20 min. AFM image. Simi-contact mode. Profile in cross-section.

Polyethylene terephthalate (PETE) film. Plasma etching - 20 min. Simi-contact-mode. Images was obtained with SPM Certus Standard.

Images size 5х5 μm, 500х500 points.

Upper left image - topography. Upper right image - phase image.

Lower left image - topography 3D. Upper right image - topography and cross-section.

Lower image - profile in cross-section.

PETE film. Plasma etching - 20 min. AFM image. Simi-contact mode. Topography. PETE film. Plasma etching - 20 min. AFM image. Simi-contact mode. Phase image.
PETE film. Plasma etching - 20 min. AFM image. Simi-contact mode. Topography 3D. PETE film. Plasma etching - 20 min. AFM image. Simi-contact mode. Topography and cross-section.
PETE film. Plasma etching - 20 min. AFM image. Simi-contact mode. Profile in cross-section.

Polyethylene terephthalate (PETE) film. Plasma etching -20 min. Simi-contact-mode. Images was obtained with SPM Certus Standard.

Images size 1,5х1,5 μm, 300х300 points.

Upper left image - topography. Upper right image - phase image.

Lower left image - topography 3D. Upper right image - topography and cross-section.

Lower image - profile in cross-section.

PETE film. Plasma etching - 40 min. AFM image. Simi-contact mode. Topography. PETE film. Plasma etching - 40 min. AFM image. Simi-contact mode. Phase image.
PETE film. Plasma etching - 40 min. AFM image. Simi-contact mode. Topography 3D. PETE film. Plasma etching - 40 min. AFM image. Simi-contact mode. Topography and cross-section.
PETE film. Plasma etching - 40 min. AFM image. Simi-contact mode. Profile in cross-section.

Polyethylene terephthalate (PETE) film. Plasma etching - 40 min. Simi-contact-mode. Images was obtained with SPM Certus Standard.

Images size 5х5 μm, 500х500 points.

Upper left image - topography. Upper right image - phase image.

Lower left image - topography 3D. Upper right image - topography and cross-section.

Lower image - profile in cross-section.

PETE film. Plasma etching - 40 min. AFM image. Simi-contact mode. Topography. PETE film. Plasma etching - 40 min. AFM image. Simi-contact mode. Phase image.
PETE film. Plasma etching - 40 min. AFM image. Simi-contact mode. Topography 3D. PETE film. Plasma etching - 40 min. AFM image. Simi-contact mode. Topography and cross-section.
PETE film. Plasma etching - 40 min. AFM image. Simi-contact mode. Profile in cross-section.

Polyethylene terephthalate (PETE) film. Plasma etching - 40 min. Simi-contact-mode. Images was obtained with SPM Certus Standard.

Images size 1,5х1,5 μm, 300х300 points.

Upper left image - topography. Upper right image - phase image.

Lower left image - topography 3D. Upper right image - topography and cross-section.

Lower image - profile in cross-section.

PETE film. Plasma etching - 60 min. AFM image. Simi-contact mode. Topography. PETE film. Plasma etching - 60 min. AFM image. Simi-contact mode. Phase image.
PETE film. Plasma etching - 60 min. AFM image. Simi-contact mode. Topography 3D. PETE film. Plasma etching - 60 min. AFM image. Simi-contact mode. Topography and cross-section.
PETE film. Plasma etching - 60 min. AFM image. Simi-contact mode. Profile in cross-section.

Polyethylene terephthalate (PETE) film. Plasma etching - 60 min. Simi-contact-mode. Images was obtained with SPM Certus Standard.

Images size 5х5 μm, 500х500 points.

Upper left image - topography. Upper right image - phase image.

Lower left image - topography 3D. Upper right image - topography and cross-section.

Lower image - profile in cross-section.

PETE film. Plasma etching - 60 min. AFM image. Simi-contact mode. Topography. PETE film. Plasma etching - 60 min. AFM image. Simi-contact mode. Phase image.
PETE film. Plasma etching - 60 min. AFM image. Simi-contact mode. Topography 3D. PETE film. Plasma etching - 60 min. AFM image. Simi-contact mode. Topography and cross-section.
PETE film. Plasma etching - 60 min. AFM image. Simi-contact mode. Profile in cross-section.

Polyethylene terephthalate (PETE) film.Plasma etching - 60 min. Simi-contact-mode. Images was obtained with SPM Certus Standard.

Images size 1,5х1,5 μm, 300х300 points.

Upper left image - topography. Upper right image - phase image.

Lower left image - topography 3D. Upper right image - topography and cross-section.

Lower image - profile in cross-section.


Зависимость удельной  площади поверхности пленки ПЭТФ от времени обработки в плазме.

Change in specific surface area of PETE film from time plasma etching. The black line - randomly selected plots 5x5 μm. Red line - plots 1,5x1,5 μm with a relatively small difference in height.

The samples provided A.A. Chalykh, Ph.D. Institute of Physical Chemistry and Electrochemistry named after A.N.Frumkin, Academy of Sciences (RAS IFHE).

Латексные сферы  покрытые пленкой воды, АСМ изображение. Режим "фазы".

Latex microspheres Gallery Glue drops on glass


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